DELMIC produces correlative light and electron microscopy solutions.
DELMIC originated as a result of the development of the SECOM platform which was conceived by Charged Particle Optics group of Delft University of Technology.
The SECOM platform integrates a fluorescence microscope with an electron microscope. This combines the functional information of the fluorescence microscope with the unlimited structural resolution of the electron microscope and allows for faster, easier and better biological research.
At the end of 2011 the company obtained the SPARC system from the Photonic Materials Group at AMOLF. The SPARC detector detects the light that is generated by the electrons of the electron microscope when they hit the sample. This emitted light can be used to study material composition, or study the behaviour of nanostructures, such as for nanophotonics.
|Participation since||November 2013|
|Founders||Sander den Hoedt
Jaccob van Hoogenboom
|Linked faculty||Faculty of Applied Sciences|
|Company history and milestones|
|2011||Delmic obtained the SPARC system from the Photonic Materials Group at AMOLF.|
|2013||Microscopy Today Innovation Award (SECOM)|
|2014||DELMIC also launched the Delphi system|
|2014||MRS Innovation in Materials Characterization Award|
|2015||Microscopy Today Innovation Award (Delphi)|